Search Results - Falgayrettes, P.

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  1. 1
    Study of light emission and collection in a transparent dielectric cantilever‐based near‐field optical probe

    Study of light emission and collection in a transparent dielectric cantilever‐based near‐field optical probe by MOURCHED, B., NATIVEL, E.L., KRIBICH, R., FALGAYRETTES, P., GALL‐BORRUT, P.

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  2. 2
    Near-field microscopy and fluorescence spectroscopy: application to chromosomes labelled with different fluorophores

    Near-field microscopy and fluorescence spectroscopy: application to chromosomes labelled with different fluorophores by MAHIEU-WILLIAME, L, FALGAYRETTES, P, NATIVEL, L, GALL-BORRUT, P, COSTA, L, SALEHZADA, T, BISBAL, C

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  3. 3
    Phenomenological and electrical modelization of microcoaxial probes for SNMM

    Phenomenological and electrical modelization of microcoaxial probes for SNMM by Castagné, M., Falgayrettes, P., Nativel, L., Marchetti, M.

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  4. 4
    Near-field electromagnetic tomography applied to current density reconstruction in metallized capacitors

    Near-field electromagnetic tomography applied to current density reconstruction in metallized capacitors by Nativel, E.L., Talbert, T., Martire, T., Joubert, C., Daude, N., Falgayrettes, P.

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  5. 5
    Near-field electromagnetic tomography applied to current density reconstruction in metallized capacitors

    Near-field electromagnetic tomography applied to current density reconstruction in metallized capacitors by Nativel, E L, Talbert, T, Martire, T, Joubert, C, Daude, N, Falgayrettes, P

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  6. 6
    Near field optical behaviour of C supertips

    Near field optical behaviour of C supertips by Castagné, M., Benfedda, M., Lahimer, S., Falgayrettes, P., Fillard, J.P.

    Published in Ultramicroscopy
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  7. 7
    MMIC's characterization by very near-field technique

    MMIC's characterization by very near-field technique by Nativel, L., Marchetti, M., Falgayrettes, P., Castagné, M., Gasquet, D., Gall-Borrut, P., Castel, M.

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  8. 8
    Silicon technology‐based micro‐systems for atomic force microscopy/photon scanning tunnelling microscopy

    Silicon technology‐based micro‐systems for atomic force microscopy/photon scanning tunnelling microscopy by Gall‐Borrut, P., Belier, B., Falgayrettes, P., Castagne, M., Bergaud, C., Temple‐Boyer, P.

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  9. 9
    InP-based photonic micro-sensor for near field optical investigations

    InP-based photonic micro-sensor for near field optical investigations by Bélier, B., Castagne, M., Falgayrettes, P., Bonnafé, J., Santoso, A., Leclercq, J. L.

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