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Search Results - Farmanesh, F.
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Frequency dependence of single-event upset in advanced commercial PowerPC microprocessors
by
Irom, F.
,
Farmanesh, F.F.
Published in
IEEE transactions on nuclear science
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Single-event upset in commercial silicon-on-insulator PowerPC microprocessors
by
Irom, F.
,
Farmanesh, F.F.
,
Johnston, A.H.
,
Swift, G.M.
,
Millward, D.G.
Published in
IEEE transactions on nuclear science
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Single-event upset in highly scaled commercial silicon-on-insulator PowerPC microprocessors
by
Irom, F.
,
Farmanesh, F.H.
Published in
IEEE transactions on nuclear science
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Single-Event Upset and Scaling Trends in New Generation of the Commercial SOI PowerPC Microprocessors
by
Irom, F.
,
Farmanesh, F.
,
Kouba, C.K.
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IEEE transactions on nuclear science
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Single-event upset in evolving commercial silicon-on-insulator microprocessor technologies
by
Irom, F.
,
Farmanesh, F.H.
,
Swift, G.M.
,
Johnston, A.H.
,
Yoder, G.L.
Published in
IEEE transactions on nuclear science
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Single-event upset in the PowerPC750 microprocessor
by
Swift, G.M.
,
Fannanesh, F.F.
,
Guertin, S.M.
,
Irom, F.
,
Millward, D.G.
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IEEE transactions on nuclear science
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Validation of an SEU simulation technique for a complex processor: PowerPC7400
by
Rezgui, S.
,
Swift, G.M.
,
Velazco, R.
,
Farmanesh, F.F.
Published in
IEEE transactions on nuclear science
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Ieee Transactions On Nuclear Science
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Subjects
Engineering
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Engineering, Electrical & Electronic
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Microprocessors
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Nuclear Science & Technology
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7
Science & Technology
7 results
7
Technology
7 results
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Single Event Upset
6 results
6
Cyclotron
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Heavy Ions
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Registers
5 results
5
Voltage
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Cross Sections
4 results
4
Electric Potential
4 results
4
Radiation Effects
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Silicon On Insulator Technology
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Space Technology
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Heavy Ion
3 results
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Laboratories
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Manufacturing Processes
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Processors
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Ieee Xplore (Online Service)
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Ieee Xplore
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