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Single-event upset in highly scaled commercial silicon-on-insulator PowerPC microprocessors
by
Irom, F.
,
Farmanesh, F.H.
Published in
IEEE transactions on nuclear science
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Single-event upset in evolving commercial silicon-on-insulator microprocessor technologies
by
Irom, F.
,
Farmanesh, F.H.
,
Swift, G.M.
,
Johnston, A.H.
,
Yoder, G.L.
Published in
IEEE transactions on nuclear science
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