Search Results - Faurax, O.

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  1. 1
    Robustness of circuits under delay-induced faults : test of AES with the PAFI tool

    Robustness of circuits under delay-induced faults : test of AES with the PAFI tool by Faurax, O., Tria, A., Freund, L., Bancel, F.

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    A generic method for fault injection in circuits

    A generic method for fault injection in circuits by Faurax, O., Freund, L., Tria, A., Muntean, T., Bancel, F.

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