Scanning ion-conductance microscope with modulation of the sample position along the Z-coordinate and separate Z-axial and lateral (X, Y) scanning by Zhukov, M V, Lukashenko, S Yu, Sapozhnikov, I D, Felshtyn, M L, Gorbenko, O M, Golubok, A O

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Diagnostics of semiconductor structures by means of an apertureless near-field terahertz microscope by Trukhin, V. N., Golubo, A. O., Lyutetsky, A. V., Matveyev, B. A., Pikhtin, N. A., Samoilov, L. L., Sapozhnikov, I. D., Tarasov, I. S., Fel’shtyn, M. L., Khor’kov, D. P.

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On the Spatial Resolution of a Piezoresonance Probe Sensor with a Tungsten Needle by Gorbenko, O. M., Zhukov, M. V., Lukashenko, S. Yu, Pichahchi, S. V., Sapozhnikov, I. D., Felshtyn, M. L., Golubok, A. O.

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Behavioral Features of the Approach Curve of a Scanning Ion-Conductance Microscope by Lukashenko, S. Yu, Gorbenko, O. M., Zhukov, M. V., Pichahchi, S. V., Sapozhnikov, I. D., Felshtyn, M. L., Golubok, A. O.

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Features of combining scanning probe microscope with optical and scanning electron microscopes by Sapozhnikov, I D, Gorbenko, O M, Felshtyn, M L, Zhukov, M V, Golubok, A O

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Interaction of terahertz electromagnetic radiation with a probe-object system in a terahertz apertureless near-field microscope by Trukhin, V. N., Andrianov, A. V., Bykov, V. A., Golubok, A. O., Zinov’ev, N. N., Samoilov, L. L., Sapozhnikov, I. D., Trukhin, A. V., Fel’shtyn, M. L.

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The combination of scanning electron and scanning probe microscopy by Sapozhnikov, I. D., Gorbenko, O. M., Felshtyn, M. L., Golubok, A. O.

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Resonant Mass Detector Based on Carbon Nanowhiskers with Traps for Nanoobjects Weighing by Lukashenko, Stanislav Y., Mukhin, Ivan S., Komissarenko, Filipp E., Gorbenko, Olga M., Sapozhnikov, Ivan D., Felshtyn, Michael L., Uskov, Alexander V., Golubok, Alexander O.

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