Search Results - Feltham, D.B.I.

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  1. 1
    Accurate estimation of defect-related yield loss in reconfigurable VLSI circuits

    Accurate estimation of defect-related yield loss in reconfigurable VLSI circuits by Khare, J., Feltham, D.B.I., Maly, W.

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  2. 2
    Physically realistic fault models for analog CMOS neural networks

    Physically realistic fault models for analog CMOS neural networks by Feltham, D.B.I., Maly, W.

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  3. 3
    Limitations to the size of single-chip electronic neural networks

    Limitations to the size of single-chip electronic neural networks by Feltham, D.B.I., Maly, W.

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    Conference Proceeding
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  4. 4
    Current sensing for built-in testing of CMOS circuits

    Current sensing for built-in testing of CMOS circuits by Feltham, D.B.I., Nigh, P.J., Carley, L.R., Maly, W.

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  5. 5
    Smart-substrate multichip-module systems

    Smart-substrate multichip-module systems by Maly, W., Feltham, D.B.I., Gattiker, A.E., Hobaugh, M.D., Backus, K., Thomas, M.E.

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