Search Results - Fesiienko, Oleh

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    Plasma induced damage on AlGaN/GaN heterostructure during gate opening for power devices

    Plasma induced damage on AlGaN/GaN heterostructure during gate opening for power devices by Fesiienko, O., Petit-Etienne, C., Darnon, M., Soltani, A., Maher, H., Pargon, E.

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  2. 2
    Enhancing minority carrier lifetime in Ge: Insights from HF and HCl cleaning procedures

    Enhancing minority carrier lifetime in Ge: Insights from HF and HCl cleaning procedures by Chapotot, Alexandre, Chrétien, Jérémie, Fesiienko, Oleh, Pargon, Erwine, Cho, Jinyoun, Dessein, Kristof, Boucherif, Abderraouf, Hamon, Gwenaëlle, Darnon, Maxime

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