Search Results - Fewer, D.T.

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    Defect annealing in a II–VI laser diode structure under intense optical excitation

    Defect annealing in a II–VI laser diode structure under intense optical excitation by Jordan, C., Fewer, D.T., Donegan, J.F., Logue, F.P., McCabe, E.M., Huynh, A., Taniguchi, S., Hino, T., Nakano, K., Ishibashi, A.

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  2. 2
    Imaging in fluorescence direct-view microscopy

    Imaging in fluorescence direct-view microscopy by Fewer, D.T., Hewlett, S.J., McCabe, E.M.

    Published in Optics communications
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