Search Results - Fischione, E.A.

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  1. 1
    Applications of plasma cleaning for electron microscopy

    Applications of plasma cleaning for electron microscopy by Isabell, T.C., Fischione, P.E., Fischione, E.A.

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    A Small Spot, Inert Gas, Ion Milling Process as a Complementary Technique to Focused Ion Beam Specimen Preparation

    A Small Spot, Inert Gas, Ion Milling Process as a Complementary Technique to Focused Ion Beam Specimen Preparation by Fischione, Paul E., Williams, Robert E.A., Genç, Arda, Fraser, Hamish L., Dunin-Borkowski, Rafal E., Luysberg, Martina, Bonifacio, Cecile S., Kovács, András

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