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Search Results - Fledell, Evan
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The IEEE EPS Packaging Benchmark Suite
by
Guo, Fei
,
Aygun, Kemal
,
Becker, W. Dale
,
Talocia, Stefano Grivet
,
Hejase, Jose A.
,
Wong, Wui-Weng
,
Zhou, Tingdong
,
Barnes, Heidi
,
Peng, Zhen
,
Pelger, Alexander
,
Sahouli, Mohamed
,
Schutt-Aine, Jose
,
Ling, Feng
,
Griese, Elmar
,
Paladhi, Pavel Roy
,
Sharma, Rohit
,
Pham, Nam
,
Winkel, Thomas-Michael
,
Fledell, Evan
,
Hill, Michael J.
,
Silva, Benjamin
,
Hu, Kaisheng
,
Aronsson, Jonatan
,
Liu, Chang
,
Jeong, Yiru
,
Yilmaz, Ali E.
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PCB manufacturing variation impact on high frequency measurement fixtures
by
Fledell, E
,
Grossman, B
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Workshops and short courses
by
Grossman, Brett
,
Fledell, Evan
,
Redmond, Kevin
Published in
IEEE microwave magazine
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Adventures in measurement
by
Grossman, Brett
,
Fledell, Evan
,
Acar, Erkan
Published in
IEEE microwave magazine
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Adventures in Measurement: A Signal Integrity Perspective to the Correlation Between Assimilation and Measurement
by
Grossman, Brett
,
Fledell, Evan
,
Acar, Erkan
Published in
IEEE microwave magazine
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Microwave Multiport Measurements for the Digital World
by
Ferrero, A
,
Teppati, V
,
Fledell, E
,
Grossman, B
,
Ruttan, T
Published in
IEEE microwave magazine
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Ieee Microwave Magazine
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