Raman study of directly synthetized graphene oxide films on Si, SiO2/Si and GaAs by remote-catalyzed CVD by Rocha-Arredondo, L.E., Ortega-Gallegos, J., Flores-Camacho, J.M., Balderas-Navarro, R.E.

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Determination of the layered structure of baryta based heritage photographs by infrared ellipsometry by Flores-Camacho, J.M., Nieto-Villena, A., Martínez, J.R., de la Cruz-Mendoza, J.A., Ortega-Zarzosa, G., Solbes-García, Á., Balderas-Navarro, R.E., Lastras-Martnez, A.

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In situ monitoring of the 2D-3D growth-mode transition in In0.3Ga0.7As/GaAs (0 0 1) by reflectance-difference spectroscopy by MEDEL-RUIZ, C. I, LASTRAS-MARTINEZ, A, BALDERAS-NAVARRO, R. E, GALLARDO, S. L, MENDEZ-GARCIA, V. H, FLORES-CAMACHO, J. M, GAONA-COUTO, A, LASTRAS-MARTINEZ, L. F

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In situ monitoring of the 2D–3D growth-mode transition in In 0.3Ga 0.7As/GaAs (0 0 1) by reflectance-difference spectroscopy by Medel-Ruiz, C.I, Lastras-Martı́nez, A, Balderas-Navarro, R.E, Gallardo, S.L, Méndez-Garcı́a, V.H, Flores-Camacho, J.M, Gaona-Couto, A, Lastras-Martı́nez, L.F

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