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In situ observations of nanopores and SiC nanoparticles on graphene using electron beam irradiation and heating
by
Lu, N.
,
Floresca, H.C.
,
Wang, J.
,
Kim, M.
Published in
Microscopy and microanalysis
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Large Area Mapping of Graphene Grain Structure and Orientation
by
Floresca, H.C.
,
Hinojos, D.
,
Lu, N.
,
Chan, J.
,
Colombo, L.
,
Wallace, R.M.
,
Wang, J.
,
Kim, Jiyoung
,
Kim, Moon J.
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Effects of Film Stress Modulation Using TiN Metal Gate on Stress Engineering and Its Impact on Device Characteristics in Metal Gate/High-[Formula Omitted] Dielectric SOI FinFETs
by
Kang, Chang Yong
,
Yang, Ji-Woon
,
Oh, Jungwoo
,
Choi, Rino
,
Suh, Young Jun
,
Floresca, H.C
,
Kim, Jiyoung
,
Kim, Moon
,
Lee, Byoung Hun
,
Tseng, Hsing-Huang
,
Jammy, R
Published in
IEEE electron device letters
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Effects of Film Stress Modulation Using TiN Metal Gate on Stress Engineering and Its Impact on Device Characteristics in Metal Gate/High- k Dielectric SOI FinFETs
by
Chang Yong Kang
,
Ji-Woon Yang
,
Jungwoo Oh
,
Rino Choi
,
Young Jun Suh
,
Floresca, H.C.
,
Jiyoung Kim
,
Moon Kim
,
Byoung Hun Lee
,
Hsing-Huang Tseng
,
Jammy, R.
Published in
IEEE electron device letters
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