Single event effects in high-energy accelerators by Alía, Rubén García, Brugger, Markus, Danzeca, Salvatore, Cerutti, Francesco, Saraiva, Joao Pedro de Carvalho, Denz, Reiner, Ferrari, Alfredo, Foro, Lionel L, Peronnard, Paul, Røed, Ketil, Secondo, Raffaello, Steckert, Jens, Thurel, Yves, Toccafondo, Iacocpo, Uznanski, Slawosz

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Neutrons-Induced IGBT Failure: Effects of the Number of Tested Devices on the Cross Section Calculation by Touboul, Antoine D., Foro, Lionel L., Wrobel, Frederic, Guetarni, Karima, Boch, Jerome, Saigne, Frederic

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Gate Voltage Contribution to Neutron-Induced SEB of Trench Gate Fieldstop IGBT by Foro, L. L., Touboul, A. D., Michez, A., Wrobel, F., Rech, P., Dilillo, L., Frost, C., Saigné, F.

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Gate voltage contribution to neutron-induced SEB of Trench Gate Fieldstop IGBT by Foro, L. L., Touboul, A. D., Wrobel, F., Rech, P., Dilillo, L., Frost, C., Saigne, F.

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Varia by Andurand, Anthony, Basset, Bérengère, Bastin-Hammou, Malika, Bonnet, Corinne, Bouchet, Florence, Caracciolo Conicet, Tomás Fernández, Chiron, Pascale, David, Éric, Demelemestre, Gaëlle, Deschaux-Dutard, Delphine, de Béchillon, Marielle, Dupuy, Lionel, Duroisin, Pierre, Foro, Philippe, Furno, Martine, Guidère, Mathieu, Guillemain, Jean, Hertier, Fabien, Hoffmann, Geneviève, Klinger-Dollé, Anne-Hélène, Leduc, Claudine, Le Tallec, Yohann, López Gregoris, Rosario, Lucci, Carlamaria, Noacco, Cristina, Pascal, Jean-Noël, Pinto, Massimo, Pisano, Carmine, Raschieri, Amedeo Alessandro, Rey, Sarah, Scapin, Mathieu, Soler, Matthieu, Tassignon, Isabelle, Tollon, Bruno, Unceta Gómez, Luis, Vagenheim, Ginette, Valenti, Catherine, Wolf, Friedrich August, Zaganiaris, Jean

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