Role of zirconia phase transformation, interface processes, and Ta2O5 doping on the blistering phenomenon of molten glass in contact with zirconia-based refractories by Hell, J., Vespa, P., Cabodi, I., Citti, O., Fournet-Fayard, F., Fouletier, J., Steil, M.C.

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Blistering phenomenon of molten glass in contact with zirconia-based refractories by Hell, J., Vespa, P., Cabodi, I., Citti, O., Fournet-Fayard, F., Fouletier, J., Steil, M.C.

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Intraoperative neurophysiologic monitoring in spine surgery. Developments and state of the art in France in 2011 by Gavaret, M, Jouve, J.L, Péréon, Y, Accadbled, F, André-Obadia, N, Azabou, E, Blondel, B, Bollini, G, Delécrin, J, Farcy, J.-P, Fournet-Fayard, J, Garin, C, Henry, P, Manel, V, Mutschler, V, Perrin, G, Sales de Gauzy, J

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Response to the letter by Vedran Deletis, David B. Mac Donald, Francesco Sala and Isabel Fernandez Conejero by Gavaret, M, Jouve, J.L, Péréon, Y, Accadbled, F, André-Obadia, N, Azabou, E, Blondel, B, Bollini, G, Delécrin, J, Farcy, J.P, Fournet-Fayard, J, Garin, C, Henry, P, Manel, V, Mutschler, V, Perrin, G, Sales de Gauzy, J

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Bearing area curve based partitioning for the verification of theoretical supplemental geometry on additively manufactured lattice structures by Praniewicz, M., Fournet-Fayard, L., Fox, J.C., Cayron, C., Koutiri, I., Obaton, A.-F.

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An in-vitro evaluation of the activity of povidone-iodine against nosocomial bacterial strains by Traoré, O., Fayard, S.Fournet, Laveran, H.

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Comparison of in-vivo antibacterial activity of two skin disinfection procedures for insertion of peripheral catheters: povidone iodine versus chlorhexidine by Traoré, O., Allaert, F.A., Fournet-Fayard, S., Verrière, J.L., Laveran, H.

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Autonomic responses of blood vessels and sweat glands in patients with schizophrenia treated with olanzapine or clozapine by MUECK-WEYMANN, Michael, ACKER, Jens, AGELINK, Marcus W

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Re-Using Clock Management Unit to implement Power Gating and Retention for Leakage Reduction at the 65-nm Technology Node by Royannez, P., Jumel, F., Mair, H., Scott, D., Rachidi, A. Er, Lagerquist, R., Chau, M., Gururajarao, S., Thiruvengadam, S., Clinton, M., Menezes, V., Hollingsworth, R., Vaccani, J., Piacibello, F., Culp, N., Rosal, J., Ball, M., Ben-Amar, F., Bouetel, L., Domerego, O., Lachese, J.L., Fournet-Fayard, C., Ciroux, J., Raibaut, C., Ko, U.

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A Leakage Management System Based on Clock Gating Infrastructure for a 65-nm Digital Base-Band Modem Chip by Ko, U., Raibaut, C., Ciroux, J., Fournet-Fayard, C., Lachese, J.L., Domerego, O., Bouetel, L., Ben-Amar, F., Ball, M., Rosal, J., Culp, N., Piacibello, F., Vaccani, J., Hollingsworth, R., Menezes, V., Clinton, M., Thiruvengadam, S., Gururajarao, S., Chau, M., Lagerquist, R., Er Rachidi, A., Scott, D., Mair, H., Royannez, P., Jumel, F.

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