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Modeling the Effect of Process, Power-Supply Voltage and Temperature Variations on the Timing Response of Nanometer Digital Circuits
by
Freijedo, Judit F.
,
Semião, Jorge
,
Rodriguez-Andina, Juan J.
,
Vargas, Fabian
,
Teixeira, Isabel C.
,
Teixeira, J. Paulo
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Journal of electronic testing
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Delay modeling for power noise-aware design in Spartan-3A FPGAs
by
Freijedo, Judit F
,
Valdes, Maria D
,
Moure, Maria J
,
Costas, Lucia
,
Rodriguez-Andina, Juan J
,
Semião, Jorge
,
Vargas, Fabian
,
Teixeira, Isabel C
,
Teixeira, J Paulo
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Exploiting Parametric Power Supply and/or Temperature Variations to Improve Fault Tolerance in Digital Circuits
by
Semiao, J
,
Freijedo, Judit
,
Andina, j.
,
Vargas, F.
,
Santos, M.
,
Teixeira, I.
,
Teixeira, P.
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Journal Of Electronic Testing
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Digital Circuits
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Circuit Noise
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