Search Results - Fukuyama, Shouhei

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  1. 1
    Comprehensive Analysis of Data-Retention and Endurance Trade-Off of 40nm TaOx-based ReRAM

    Comprehensive Analysis of Data-Retention and Endurance Trade-Off of 40nm TaOx-based ReRAM by Fukuyama, Shouhei, Hayakawa, Atsuna, Yasuhara, Ryutaro, Matsuda, Shinpei, Kinoshita, Hiroshi, Takeuchi, Ken

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  2. 2
    Suppression of endurance-stressed data-retention failures of 40nm TaOx-based ReRAM

    Suppression of endurance-stressed data-retention failures of 40nm TaOx-based ReRAM by Fukuyama, Shouhei, Maeda, Kazuki, Matsuda, Shinpei, Takeuchi, Ken, Yasuhara, Ryutaro

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  3. 3
    5x Reliability Enhanced 40nm TaOx Approximate-ReRAM with Domain-Specific Computing for Real-time Image Recognition of IoT Edge Devices

    5x Reliability Enhanced 40nm TaOx Approximate-ReRAM with Domain-Specific Computing for Real-time Image Recognition of IoT Edge Devices by Yamaga, Yusuke, Deguchi, Yoshiaki, Fukuyama, Shouhei, Takeuchi, Ken

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  4. 4
    Error recovery of low resistance state in 40nm TaOx-based ReRAM

    Error recovery of low resistance state in 40nm TaOx-based ReRAM by Maeda, Kazuki, Fukuyama, Shouhei, Takeuchi, Ken, Yasuhara, Ryutaro, Mishima, Satoshi

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  5. 5
    Workload-aware Data-eviction Self-adjusting System of Multi-SCM Storage to Resolve Trade-off between SCM Data-retention Error and Storage System Performance

    Workload-aware Data-eviction Self-adjusting System of Multi-SCM Storage to Resolve Trade-off between SCM Data-retention Error and Storage System Performance by Kinoshita, Reika, Matsui, Chihiro, Suzuki, Atsuya, Fukuyama, Shouhei, Takeuchi, Ken

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  6. 6
    Study on nanoscale patterning of SAMs by using near-field photothermal desorption

    Study on nanoscale patterning of SAMs by using near-field photothermal desorption by Fukuyama, Shouhei, Jinde, Mao, Taguchi, Yoshihiro

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