Anisotropy and interface structure in sputtered Co/Pt multilayers on Si by Rozatian, A.S.H., Fulthorpe, B.D., Hase, T.P.A., Read, D.E., Ashcroft, G., Joyce, D.E., Grundy, P.J., Amighian, J., Tanner, B.K.

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High resolution X-ray scattering from nanotechnology materials by Tanner, B.K., Hase, T.P.A., Clarke, J., Pape, I., Li-Bassi, A., Fulthorpe, B.D.

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Structural and magnetic changes on annealing permalloy/copper multilayers by Fulthorpe, B.D, Hase, T.P.A, Tanner, B.K, Marrows, C.H, Hickey, B.J

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X-ray reflection anomalous fine structure analysis of the stability of permalloy/copper multilayers by Luo, G.M, Mai, Z.H, Hase, T.P.A, Fulthorpe, B.D, Tanner, B.K, Marrows, C.H, Hickey, B.J

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Effect of the Cu capping thickness on the magnetic properties of thin Ni/Cu(0 0 1) films by Vaz, C.A.F, Lauhoff, G, Bland, J.A.C, Fulthorpe, B.D, Hase, T.P.A, Tanner, B.K, Langridge, S, Penfold, J

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Structural and chemical diagnosis of magnetic multilayers by RAFS and XRF techniques by Mai, Z.H., Luo, G.M., Liu, C.X., Li, M.H., Jiang, H.W., Lai, W.Y., Wang, J., Ding, Y.F., Hase, T.P.A., Fulthorpe, B.D., Tanner, B.K.

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Soft X-ray magnetic scattering study of rotational magnetisation processes in cobalt/copper multilayers by Hase, T.P.A, Fulthorpe, B.D, Wilkins, S.B, Tanner, B.K, Marrows, C.H, Hickey, B.J

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