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Nanoalignment mask fabricated directly on Si by AFM
by
Huang, WenHao
,
Dang, Xueming
,
Hu, Qiao
,
Xia, Yi
,
Telllo, Marta
,
Calleja, Montserrat
,
García, Ricardo
,
Gómez-Rodńguez, J. M.
,
Baro, A.
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Surface and interface analysis
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Surface And Interface Analysis
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Afm
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Condensed Matter: Structure, Mechanical And Thermal Properties
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Electron, Ion, And Scanning Probe Microscopy
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Scanning Probe Microscopy: Scanning Tunneling, Atomic Force, Scanning Optical, Magnetic Force, Etc
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