Search Results - Gębara P.
-
101
-
102
-
103
-
104
-
105
-
106
-
107
Fin thickness asymmetry effects in multiple-gate SOI FETs (MuGFETs)
Conference Proceeding -
108
-
109
-
110
-
111
-
112
-
113
-
114
Integration of high-k gate stack systems into planar CMOS process flows
Conference Proceeding -
115
-
116