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Structural analysis of strained LaVO\(_3\) thin films
by
Rotella, H
,
Copie, O
,
G Mouillard-Steciuk
,
Ouerdane, H
,
Boullay, P
,
Roussel, P
,
Morales, M
,
David, A
,
Pautrat, A
,
Mercey, B
,
Lutterotti, L
,
Chateigner, D
,
Prellier, W
Published in
arXiv.org
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Complex Systems
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Crystal Structure
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Diffraction
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Electron Diffraction
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Epitaxial Growth
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Lattice Parameters
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Mapping
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Structural Analysis
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Substrates
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Thin Films
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Transmission Electron Microscopy
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X-Ray Diffraction
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