Search Results - GRONKOWSKI, Jerzy

  • Showing 1 - 7 results of 7
Refine Results
  1. 1
    X-ray topography studies of microdefects in silicon

    X-ray topography studies of microdefects in silicon by Kowalski, Grzegorz, Lefeld-Sosnowska, Maria, Gronkowski, Jerzy, Borowski, Janusz

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  2. 2
    High-resolution characterization of microdefects by X-ray diffuse scattering

    High-resolution characterization of microdefects by X-ray diffuse scattering by Gronkowski, Jerzy, Borowski, Janusz, Zieli ska-Rohozi ska, El bieta

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  3. 3
    USAXS study of influence of gelator polarity on organogel structure

    USAXS study of influence of gelator polarity on organogel structure by GRIGORIEW, Helena, TEMERIUSZ, Andrzej, CHMIELEWSKA, Dagmara, GRONKOWSKI, Jerzy, MIRKOWSKA, Monika

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  4. 4
    Propagation of X-rays in distorted crystals under dynamical diffraction

    Propagation of X-rays in distorted crystals under dynamical diffraction by Gronkowski, Jerzy

    Published in Physics reports
    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  5. 5
    X-ray diffuse-scattering study of defects in α-sapphire

    X-ray diffuse-scattering study of defects in α-sapphire by Gronkowski, Jerzy, Borowski, Janusz, Zielińska-Rohozińska, Elżbieta, Kowalska, Małgorzata, Pakuła, Krzysztof

    Get full text
    Items that this one cites
    Article
    Save to List
    Saved in:
  6. 6
    X-ray diffuse scattering from extended microdefects of orthorhombic symmetry for Si single crystals

    X-ray diffuse scattering from extended microdefects of orthorhombic symmetry for Si single crystals by Borowski, Janusz, Gronkowski, Jerzy

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  7. 7
    X-ray topographic study of defects in annealed silicon

    X-ray topographic study of defects in annealed silicon by Gronkowski, J, Lefeld-Sosnowska, M, Zielinska-Rohozinska, E

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:

Search Tools: