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Frequency Effect on Voltage Linearity of ZrO2-Based RF Metal-Insulator-Metal Capacitors
by
BERTAUD, Thomas
,
BLONKOWSKI, Serge
,
BERMOND, Cédric
,
VALLEE, Christophe
,
GONON, Patrice
,
GROS-JEAN, Michaël
,
FLECHET, Bernard
Published in
IEEE electron device letters
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Frequency Effect on Voltage Linearity of [Formula Omitted]-Based RF Metal-Insulator-Metal Capacitors
by
Bertaud, Thomas
,
Blonkowski, Serge
,
Bermond, CÉdric
,
Vallee, Christophe
,
Gonon, Patrice
,
Gros-Jean, MichaËl
,
Flechet, Bernard
Published in
IEEE electron device letters
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Quantitative depth profiling of ultrathin high-k stacks with full spectrum time of flight–secondary ion mass spectrometry
by
Py, Matthieu
,
Barnes, Jean-Paul
,
Boujamaa, Rachid
,
Gros-Jean, Michael
,
Nakajima, Kaoru
,
Kimura, Kenji
,
Roukoss, Charbel
,
Pelissier, Bernard
,
Gambacorti, Narciso
Published in
Journal of vacuum science and technology. B, Nanotechnology & microelectronics
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Frequency Effect on Voltage Linearity of hboxZrO 2-Based RF Metal-Insulator-Metal Capacitors
by
Bertaud, Thomas
,
Blonkowski, Serge
,
Bermond, Cedric
,
Vallee, Christophe
,
Gonon, Patrice
,
Gros-Jean, Michael
,
Flechet, Bernard
Published in
IEEE electron device letters
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Frequency Effect on Voltage Linearity of ZrO 2 -Based RF Metal-Insulator-Metal Capacitors
by
Bertaud, Thomas
,
Blonkowski, Serge
,
Bermond, Cedric
,
Vallee, Christophe
,
Gonon, Patrice
,
Gros-Jean, Michael
,
Flechet, Bernard
Published in
IEEE electron device letters
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Ieee Electron Device Letters
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Journal Of Vacuum Science & Technology. B, Microelectronics And Nanometer Structures Processing, Measurement And Phenomena
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Capacitors
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Linearity
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American Institute Of Physics:jisc Collections:transitional Journals Agreement 2021-23 (Reading List)
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