Influence of SiH4 process step on physical and electrical properties of advanced copper interconnects by Chhun, S., Gosset, L.G., Casanova, N., Guillaumond, J.F., Dumont-Girard, P., Federspiel, X., Pantel, R., Arnal, V., Arnaud, L., Torres, J.

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Bias-stress-induced evolution of the dielectric properties of porous-ULK/ copper advanced interconnects by Guedj, C., Portier, X., Mondon, F., Arnal, V., Guillaumond, J.F., Arnaud, L., Barnes, J.P., Jousseaume, V., Roule, A., Maitrejean, S., Chapelon, L.L., Reimbold, G., Torres, J., Passemard, G.

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Electro-optical reliability characterization of advanced Cu/low-k interconnects by Guedj, C., Guillaumond, J.F., Mondon, F., Arnaud, L., Arnal, V., Reimbold, G., Torres, J.

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Influence of diffusion barrier on reliability. Identification of diffusion paths in Cu/porous low k interconnect by Guillaumond, J.F., Arnaud, L., Guedj, C., Arnal, V., Besling, W.F.A., Reimbold, G., Dupeux, M., Torres J

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Effect of pore sealing on the reliability of ULK/Cu interconnects by Guedj, C., Arnaud, L., Fayolle, M., Jousseaume, V., Guillaumond, J.F., Cluzel, J., Toffoli, A., Reimbold, G., Bouchu, D.

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Influence of the sidewall diffusion barrier on the transport properties of advanced Cu/low- k interconnects by Guedj, Cyril, Guillaumond, Jean-Frédéric, Arnaud, Lucile, Arnal, Vincent, Aimadeddine, Mohamed, Reimbold, Gilles, Torres, Joaquin

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Analysis of Electromigration Voiding Phenomena in Cu Interconnects by Arnaud, L., Guillaumond, J.F., Claret, N., Cayron, C., Guedj, C., Dupeux, M., Arnal, V., Reimbold, G., Passemard, G., Torres, J.

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Analysis of resistivity in nano-interconnect: full range (4.2-300 K) temperature characterization by Guillaumond, J.F., Arnaud, L., Mourier, T., Fayolle, M., Pesci, O., Reimbold, G.

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Influence of dielectric layers on electromigration results in Cu interconnects by Arnaud, L., Guillaumond, J.F., Pesci, O., Fayolle, M., Reimbold, G.

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Influence of the diffusion barriers on the dielectric reliability of ULK/Cu advanced interconnects by Guedj, C., Arnal, V., Guillaumond, J.F., Arnaud, L., Barnes, J.P., Toffoli, A., Jousseaume, V., Roule, A., Maitrejean, S., Chapelon, L.L., Reimbold, G., Torres, J., Passemard, G.

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Reliability challenges accompanied with interconnect downscaling and ultra low-k dielectrics by Hoofman, R.J.O.M., Michelon, J., Bancken, P.H.L., Daamen, R., Verheijden, G.J.A.M., Arnal, V., Hinsinger, O., Gosset, L.G., Humbert, A., Besling, W.F.A., Goldberg, C., Fox, R., Michaelson, L., Guedj, C., Guillaumond, J.F., Jousseaume, V., Arnaud, L., Gravesteijn, D.J., Torres, J., Passemard, G.

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Integration of ALD TaN barriers in porous low-k interconnect for the 45 nm node and beyond; solution to relax electron cattering effect by BESLING, W. F. A, ARNAL, V, GUILLAUMOND, J. F, GUEDJ, C, BROEKAART, M, CHAPELON, L. L, FARCY, A, ARNAUD, L, TORRES, J

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Challenges for interconnect of future CMOS generations : Implementation of emerging processes and alternative architectures by ARNAL, V, GOSSET, L. G, GUILLAUMOND, J. F, TORRES, J, BESLING, W. F. A, FARCY, A, CHAPELON, L. L, FUCHSMANN, A, VITIELLO, J, CHHUN, S, AIMADEDDINE, M, GUEDJ, C

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Integration of ALD TaN barriers in porous low-k interconnect for the 45 nm node and beyond; solution to relax electron scattering effect by Besling, W.F.A., Arnal, V., Guillaumond, J.R., Guedj, C., Broekaart, M., Chapelon, L.L., Farcy, A., Arnaud, L., Torres, J.

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TAp73 loss favors Smad-independent TGF-β signaling that drives EMT in pancreatic ductal adenocarcinoma by Thakur, A K, Nigri, J, Lac, S, Leca, J, Bressy, C, Berthezene, P, Bartholin, L, Chan, P, Calvo, E, Iovanna, J L, Vasseur, S, Guillaumond, F, Tomasini, R

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Stromal SLIT2 impacts on pancreatic cancer-associated neural remodeling by Secq, V, Leca, J, Bressy, C, Guillaumond, F, Skrobuk, P, Nigri, J, Lac, S, Lavaut, M-N, Bui, T-t, Thakur, A K, Callizot, N, Steinschneider, R, Berthezene, P, Dusetti, N, Ouaissi, M, Moutardier, V, Calvo, E, Bousquet, C, Garcia, S, Bidaut, G, Vasseur, S, Iovanna, J L, Tomasini, R

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Targeted imaging of pancreatic adenocarcinoma with a LDLR vector-cargo conjugate by Acier, A., Lecorche, P., Godard, M., Gassiot, F., Mercadal, N., Finetti, P., Barea, D., Rubis, M., Nowak, J., Bertucci, F., Birnbaum, D., Iovanna, J., Jacquot, G., Khrestchatisky, M., Temsamani, J., Malicet, C., Vasseur, S., Guillaumond, F.

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Study of metabolic reprogramming during pancreatic cancer progression: Metabolism of branched chain amino acids by Gouirand, Victoire, Da Costa, Q, Bidaut, G, Beloribi-Djefaflia, S, Gicquel, T, Roques, J, Iovanna, J, Guillaumond-Marchai, F, Vasseur, S

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DNA Microarray Analysis and Functional Profile of Pituitary Transcriptome Under Core-Clock Protein BMAL1 Control by Guillaumond, F., Becquet, D., Boyer, B., Bosler, O., Delaunay, F., Franc, J. L., François-Bellan, A. M.

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TAp73 loss favors Smad-independent TGF-[beta] signaling that drives EMT in pancreatic ductal adenocarcinoma by Thakur, A K, Nigri, J, Lac, S, Leca, J, Bressy, C, Berthezene, P, Bartholin, L, Chan, P, Calvo, E, Iovanna, J L, Vasseur, S, Guillaumond, F, Tomasini, R

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