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Lead frame Hillock-Induced Silicon Crack
by
Flores, R.C.
,
Fabia, M.G.
,
Nabong, M.T.
,
Soria, A.O.
,
Gabunas, C.B.
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Understanding Protective Overcoat Damages: Failure Analysis to the Next Level
by
Abitan, F.V.
,
Angeles, R.C.
,
Fabia, M.G.
,
Flores, R.C.
,
Gabunas, C.B.
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Low cost etchant for Ta-based copper barrier
by
Gabunas, C.B.
,
Abitan, F.F.
,
Stierman, R.J.
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Engineering
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Engineering, Electrical & Electronic
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Inspection
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Science & Technology
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Bonding
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Failure Analysis
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Physics, Condensed Matter
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Silicon
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Circuit Testing
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Copper
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Dielectric Materials
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Earth Observing System
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Electrostatic Discharge
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Etching
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Grounding
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Ieee Electronic Library (Iel) Conference Proceedings
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Ieee Xplore All Conference Series
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