Modeling the Random Parameters Effects in a Non-Split Model of Gate Oxide Short by Renovell, M, Gallière, Jm, Azaïs, F, Bertrand, Y

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A compact DC model of gate oxide short defect by Bouchakour, R., Portal, J.M., Gallière, J.M., Azais, F., Bertrand, Y., Renovell, M.

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Resistive Bridge Fault Model Evolution From Conventional to Ultra Deep Submicron Technologies by Polian, I., Sandip, Kundu, Galliere, Jean-Marc J.-M., Engelke, P., Renovell, Michel, Becker, P.

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Delay testing of MOS transistor with gate oxide short by Renovell, Galliere, Azais, Bertrand

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Boolean and current detection of MOS transistor with gate oxide short by Renovell, M., Galliere, J.M., Azais, F., Bertrand, Y.

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Modeling gate oxide short defects in CMOS minimum transistors by Renovell, M., Galliere, J.M., Azais, F., Bertrand, Y.

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Delay Testing Viability of Gate Oxide Short Defects by Galli re, J. M., Renovell, M., Aza s, F., Bertrand, Y.

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