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High-Resolution Phase-Contrast Imaging at XFELs
by
Schropp, A.
,
Hoppe, R.
,
Meier, V.
,
Patommel, J.
,
Seiboth, F.
,
Lee, Hae Ja
,
Nagler, B.
,
Galti er, E.C
,
Arnol d, B.
,
Hastings, J.B.
,
chroer, C.G.S
Published in
Microscopy and microanalysis
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Microscopy And Microanalysis
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A05 Fast And Ultrafast Imaging With Electrons And Photons
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Analytical And Instrumentation Science Symposia
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Electrons
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Lasers
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