Correlating drain-current with strain-induced mobility in nanoscale strained CMOSFETs by LIN, Hong-Nien, CHEN, Hung-Wei, KO, Chih-Hsin, GE, Chung-Hu, LIN, Homg-Chih, HUANG, Tiao-Yuan, LEE, Wen-Chin

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Channel backscattering characteristics of uniaxially strained nanoscale CMOSFETs by LIN, Hong-Nien, CHEN, Hung-Wei, KO, Chih-Hsin, GE, Chung-Hu, LIN, Horng-Chih, HUANG, Tiao-Yuan, LEE, Wen-Chin

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Characterizing the Channel Backscattering Behavior in Nanoscale Strained Complementary Metal Oxide Semiconductor Field-Effect Transistors by Lin, Hong-Nien, Chen, Hung-Wei, Ko, Chih-Hsin, Ge, Chung-Hu, Lin, Horng-Chih, Huang, Tiao-Yuan, Lee, Wen-Chin

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Enhanced Performance of Strained CMOSFETs Using Metallized Source/Drain Extension (M-SDE) by Chen, Hung-Wei, Ko, Chih-Hsin, Wang, Tzu-Juei, Ge, Chung-Hu, Wu, Kehuey, Lee, Wen-Chin

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The impact of uniaxial strain engineering on channel backscattering in nanoscale MOSFETs by Hong-Nien Lin, Hung-Wei Chen, Chih-Hsin Ko, Chung-Hu Ge, Horng-Chih Lin, Tiao-Yuan Huang, Wen-Chin Lee, Tang, D.D.

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Strain-Induced Channel Backscattering Modulation in Nanoscale CMOSFETs by Hung-Wei Chen, Hong-Nien Lin, Chih-Hsin Ko, Chung-Hu Ge, Horng-Chih Lin, Tiao-Yuan Huang, Wen-Chin Lee

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Channel backscattering characteristics of strained PMOSFETs with embedded SiGe source/drain by Hong-Nien Lin, Hung-Wei Chen, Chih-Hsin Ko, Chung-Hu Ge, Horng-Chih Lin, Tiao-Yuan Huang, Wen-Chin Lee

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Optimization Theory, Methods, and Applications in Engineering 2013 by Tsai, Jung-Fa, Carlsson, John Gunnar, Ge, Dongdong, Hu, Yi-Chung, Shi, Jianming

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Optimization Theory, Methods, and Applications in Engineering 2014 by Tsai, Jung-Fa, Carlsson, John Gunnar, Ge, Dongdong, Hu, Yi-Chung, Shi, Jianming

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Optimization Theory, Methods, and Applications in Engineering by Tsai, Jung-Fa, Carlsson, John Gunnar, Ge, Dongdong, Hu, Yi-Chung, Shi, Jianming

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