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Mapping Giant Oscillator Excitons in Semiconducting Nano Wires
by
Chisholm, Matthew F.
,
Ge, JingXuen
,
Tian, Mengkun
,
Peter Wagner, Hans
,
Duscher, Gerd
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Microscopy and microanalysis
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Microscopy And Microanalysis
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Analytical And Instrumentation Science Symposia
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Materials Characterization Using Atomic-Scale Edx/Eels Spectroscopy
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Oxford Journals Online
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Cambridge University Press:jisc Collections:cambridge University Press Read And Publish Agreement 2021-24 (Reading List)
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