Search Results - Geantil, Peter

  • Showing 1 - 3 results of 3
Refine Results
  1. 1
    Using X-ray microbeam diffraction to study the long-range internal stresses in aluminum processed by ECAP

    Using X-ray microbeam diffraction to study the long-range internal stresses in aluminum processed by ECAP by Lee, I-Fang, Phan, Thien Q., Levine, Lyle E., Tischler, Jonathan Z., Geantil, Peter T., Huang, Yi, Langdon, Terence G., Kassner, Michael E.

    Published in Acta materialia
    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  2. 2
    Disordered long-range internal stresses in deformed copper and the mechanisms underlying plastic deformation

    Disordered long-range internal stresses in deformed copper and the mechanisms underlying plastic deformation by Levine, Lyle E., Geantil, Peter, Larson, Bennett C., Tischler, Jonathan Z., Kassner, Michael E., Liu, Wenjun, Stoudt, Mark R., Tavazza, Francesca

    Published in Acta materialia
    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  3. 3
    Validating classical line profile analyses using microbeam diffraction from individual dislocation cell walls and cell interiors

    Validating classical line profile analyses using microbeam diffraction from individual dislocation cell walls and cell interiors by Levine, Lyle E., Geantil, Peter, Larson, Bennett C., Tischler, Jonathan Z., Kassner, Michael E., Liu, Wenjun

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:

Search Tools: