Search Results - Gebrie, Tadesse Gergiso

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    Uncertainty evaluation of thickness and warp of a silicon wafer measured by a spectrally resolved interferometer

    Uncertainty evaluation of thickness and warp of a silicon wafer measured by a spectrally resolved interferometer by Drijarkara, Agustinus Praba, Gebrie, Tadesse Gergiso, Lee, Jae Yong, Kang, Chu-Shik

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