Search Results - Geckeler, R.D.

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    Improving the Measurement of the Diameter of Si Spheres

    Improving the Measurement of the Diameter of Si Spheres by Nicolaus, R.A., Geckeler, R.D.

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  2. 2
    High-accuracy topography measurement of optically rough surfaces with THz radiation

    High-accuracy topography measurement of optically rough surfaces with THz radiation by Hils, B., Loffler, T., Thomson, M.D., von Spiegel, W., am Weg, C., May, T., Roskos, H.G., de Maagt, P., Doyle, D., Geckeler, R.D.

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