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Extraction of dynamic avalanche during IGBT turn off
by
Geissmann, Silvan
,
Michielis, L. De
,
Corvasce, Ch
,
Rahimo, M.
,
Andenna, M.
Published in
Microelectronics and reliability
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The impact on power semiconductor device operation due to local electric field alterations in the planar junction termination
by
Rahimo, Munaf
,
Richter, Frank
,
Fischer, Fabian
,
Vemulapati, Umamaheswara
,
Kopta, Arnost
,
Corvasce, Chiara
,
Geissmann, Silvan
,
Bellini, Marco
,
Bayer, Martin
,
Bauer, Friedhelm
Published in
Microelectronics and reliability
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