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Search Results - Gettings, Karen M. G. V.
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Study of CMOS Process Variation by Multiplexing Analog Characteristics
by
Gettings, K.
,
Boning, D.S.
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IEEE transactions on semiconductor manufacturing
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Test Circuit for Study of CMOS Process Variation by Measurement of Analog Characteristics
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Gettings, K.M.G.
,
Boning, D.S.
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Biquad implementation of an IIR filter for IQ mismatch correction in an SoC RF receiver
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Gettings, Karen M. G. V.
,
Bolstad, Andrew K.
,
Ericson, Michael N.
,
Xiao Wang
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