An Improved SEL Test of the ADV212 Video Codec by Wilcox, Edward P., Campola, Michael J., Nadendla, Seshagiri, Kadari, Madhusudan, Gigliuto, Robert A.

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Compendium of Recent Total Ionizing Dose and Displacement Damage for Candidate Spacecraft Electronics for NASA by Boutte, Alvin J., Cochran, Donna J., Chen, Dakai, Campola, Michael J., Pellish, Jonathan A., Ladbury, Raymond L., Wilcox, Edward P., Lauenstein, Jean-Marie, Gigliuto, Robert A., LaBel, Kenneth A., O'Bryan, Martha V.

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Hardness Assurance for Total Dose and Dose Rate Testing of a State-of-the-Art Off-Shore 32 nm CMOS Processor by LaBel, Kenneth A., Gigliuto, Robert A., Szabo, Carl M., Carts, Martin A., Kay, Matthew, Sinclair, Timothy, Gadlage, Matthew, Duncan, Adam, Ingalls, Dave

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Compendium of Single Event Effects, Total Ionizing Dose, and Displacement Damage for Candidate Spacecraft Electronics for NASA by LaBel, Kenneth A., O'Bryan, Martha V., Dakai Chen, Campola, Michael J., Casey, Megan C., Pellish, Jonathan A., Lauenstein, Jean-Marie, Wilcox, Edward P., Topper, Alyson D., Ladbury, Raymond L., Berg, Melanie D., Gigliuto, Robert A., Boutte, Alvin J., Cochran, Donna J., Buchner, Stephen P., Violette, Daniel P.

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Compendium of Recent Single Event Effects for Candidate Spacecraft Electronics for NASA by O'Bryan, Martha V., Dakai Chen, Campola, Michael J., Casey, Megan C., Topper, Alyson D., LaBel, Kenneth A., Pellish, Jonathan A., Lauenstein, Jean-Marie, Gigliuto, Robert A., Wilcox, Edward P., Ladbury, Raymond L., Berg, Melanie D., Davies, Robert R.

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Compendium of Single Event Effects for Candidate Spacecraft Electronics for NASA by O'Bryan, M. V., LaBel, K. A., Pellish, J. A., Lauenstein, J.-M, Dakai Chen, Marshall, C. J., Casey, M. C., Gigliuto, R. A., Sanders, A. B., Oldham, T. R., Kim, H. S., Phan, A. M., Berg, M. D., Marshall, P. W., Ladbury, R. L., Wilcox, E. P., Boutte, A. J., Musil, P. L., Overend, G. A.

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