A Method of Developing Qualification Plans for Board Products by Zhang, Jeffrey, Xu, Antai, Gitlin, Daniel

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Dynamic vs Static Burn-in for 16nm Production by Zhang, Jeffrey, Xu, Antai, Gitlin, Daniel, Yeo, Desmond

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Graded tunnelling barrier and oxygen concentration in thermally grown ultrathin SiOx gate oxide by Gitlin, Daniel, Karp, James, Moyzhes, Boris

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Graded tunnelling barrier and oxygen concentration in thermally grown ultrathin SiO x gate oxide by Gitlin, Daniel, Karp, James, Moyzhes, Boris

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Opportunities brought by sequential 3D CoolCube™ integration by Vinet, Maud, Batude, Perrine, Fenouillet-Beranger, Claire, Brunet, Laurent, Mazzochi, Vincent, Lu, Cao-Minh Vincent, Deprat, Fabien, Micout, Jessy, Previtali, Bernard, Besombes, Paul, Rambal, Nils, Andrieu, Francois, Billoint, Olivier, Brocard, Melanie, Thuries, Sebastien, Berhault, Guillaume, Dos Santos, Cristiano Lopes, Cibrario, Gerald, Clermidy, Fabien, Gitlin, Daniel, Faynot, Olivier

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Improved CV/I Methodology to Accurately Predict CMOS Technology Performance by Yeh, Ping-Chin, Nayak, Deepak K., Gitlin, Daniel

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Oxide reliability of drain engineered I/O NMOS from hot carrier injection by Yuhao Luo, Nayak, D., Gitlin, D., Ming-Yin Hao, Chia-Hung Kao, Chien-Hsun Wang

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Current through SiO2 gate oxide and its low frequency fluctuations: Trapping on charged dangling bonds with negative Hubbard U by Moyzhes, Boris, Geballe, Theodore H., Jeong, Steve, Gitlin, Daniel, Karp, James

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Understanding degradation and breakdown of SiO2 gate dielectric with “negative Hubbard U” dangling bonds by Karp, James, Gitlin, Daniel, Jeong, Steve, Moyzhes, Boris

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Mechanism and Modeling of PMOS NBTI Degradation with Drain Bias by Yuhao Luo, Orona, J., Nayak, D., Gitlin, D.

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Current through Si O 2 gate oxide and its low frequency fluctuations: Trapping on charged dangling bonds with negative Hubbard U by Moyzhes, Boris, Geballe, Theodore H., Jeong, Steve, Gitlin, Daniel, Karp, James

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Dangling bonds with “negative Hubbard U  ”: Physical model for degradation of SiO2 gate dielectric under voltage stress by Gitlin, Daniel, Karp, James, Moyzhes, Boris

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Low-temperature mobility measurements on CMOS devices by Hairapetian, A., Gitlin, D., Viswanathan, C.R.

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The effects of plasma-induced damage on transistor degradation and the relationship to field programmable gate array performance by Pagaduan, F.E., Lee, J.K.J., Vedagarbha, V., Lui, K., Hart, M.J., Gitlin, D., Takaso, T., Kamiyama, S., Nakayama, K.

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Resistance monitoring vehicle for advanced copper process technology by de Jong, J.L., Hsueh, I.-C.E., Nguyen, L.L., Nguyen, T., Gitlin, D.

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Management of Neuropsychiatric Symptoms of Dementia in Clinical Settings: Recommendations from a Multidisciplinary Expert Panel by Kales, Helen C., Gitlin, Laura N., Lyketsos, Constantine G.

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HIV Vaccine Design to Target Germline Precursors of Glycan-Dependent Broadly Neutralizing Antibodies by Steichen, Jon M., Kulp, Daniel W., Tokatlian, Talar, Escolano, Amelia, Dosenovic, Pia, Stanfield, Robyn L., McCoy, Laura E., Ozorowski, Gabriel, Hu, Xiaozhen, Kalyuzhniy, Oleksandr, Briney, Bryan, Schiffner, Torben, Garces, Fernando, Freund, Natalia T., Gitlin, Alexander D., Menis, Sergey, Georgeson, Erik, Kubitz, Michael, Adachi, Yumiko, Jones, Meaghan, Mutafyan, Andrew A., Yun, Dong Soo, Mayer, Christian T., Ward, Andrew B., Burton, Dennis R., Wilson, Ian A., Irvine, Darrell J., Nussenzweig, Michel C., Schief, William R.

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Immunization for HIV-1 Broadly Neutralizing Antibodies in Human Ig Knockin Mice by Dosenovic, Pia, von Boehmer, Lotta, Escolano, Amelia, Jardine, Joseph, Freund, Natalia T., Gitlin, Alexander D., McGuire, Andrew T., Kulp, Daniel W., Oliveira, Thiago, Scharf, Louise, Pietzsch, John, Gray, Matthew D., Cupo, Albert, van Gils, Marit J., Yao, Kai-Hui, Liu, Cassie, Gazumyan, Anna, Seaman, Michael S., Björkman, Pamela J., Sanders, Rogier W., Moore, John P., Stamatatos, Leonidas, Schief, William R., Nussenzweig, Michel C.

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Sequential Immunization Elicits Broadly Neutralizing Anti-HIV-1 Antibodies in Ig Knockin Mice by Escolano, Amelia, Steichen, Jon M., Dosenovic, Pia, Kulp, Daniel W., Golijanin, Jovana, Sok, Devin, Freund, Natalia T., Gitlin, Alexander D., Oliveira, Thiago, Araki, Tatsuya, Lowe, Sarina, Chen, Spencer T., Heinemann, Jennifer, Yao, Kai-Hui, Georgeson, Erik, Saye-Francisco, Karen L., Gazumyan, Anna, Adachi, Yumiko, Kubitz, Michael, Burton, Dennis R., Schief, William R., Nussenzweig, Michel C.

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Rapid evolution of virus sequences in intrinsically disordered protein regions by Gitlin, Leonid, Hagai, Tzachi, LaBarbera, Anthony, Solovey, Mark, Andino, Raul

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