Search Results - Gizdarski, Emil

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  1. 1
    Two-Step Dynamic Encoding for Linear Decompressors

    Two-Step Dynamic Encoding for Linear Decompressors by Gizdarski, Emil

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  2. 2
    Construction and Analysis of Augmented Time Compactors

    Construction and Analysis of Augmented Time Compactors by Gizdarski, Emil

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  3. 3
    Constructing Augmented Multimode Compactors

    Constructing Augmented Multimode Compactors by Gizdarski, E.

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  4. 4
    SPIRIT: a highly robust combinational test generation algorithm

    SPIRIT: a highly robust combinational test generation algorithm by Gizdarski, E., Fujiwara, H.

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  5. 5
    Fully X-tolerant, very high scan compression

    Fully X-tolerant, very high scan compression by Wohl, Peter, Waicukauski, John A, Neuveux, Frederic, Gizdarski, Emil

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  6. 6
    Detection of Delay Faults in Memory Address Decoders

    Detection of Delay Faults in Memory Address Decoders by Gizdarski, Emil

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  7. 7
    Constructing augmented time compactors

    Constructing augmented time compactors by Gizdarski, Emil

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  8. 8
    Changing the scan enable during shift

    Changing the scan enable during shift by Sitchinava, N., Gizdarski, E., Samaranayake, S., Neuveux, F., Kapur, R., Williams, T.W.

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  9. 9
    Built-in self-test for folded bit-line Mbit DRAMs

    Built-in self-test for folded bit-line Mbit DRAMs by Gizdarski, Emil

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  10. 10
    A framework for low complexity static learning

    A framework for low complexity static learning by Gizdarski, E., Fujiwara, H.

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  11. 11
    Enabling Effective Yield Learning through Actual DFM-Closure at the SoC Level

    Enabling Effective Yield Learning through Actual DFM-Closure at the SoC Level by Appello, D., Tancorre, V., Green, G., Hay, C., Gizdarski, E.

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  12. 12
    Hierarchical compactor design for diagnosis in deterministic logic BIST

    Hierarchical compactor design for diagnosis in deterministic logic BIST by Wohl, P., Waicukauski, J.A., Patel, S., Hay, C., Gizdarski, E., Mathew, B.

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  13. 13
    Spirit: satisfiability problem implementation for redundancy identification and test generation

    Spirit: satisfiability problem implementation for redundancy identification and test generation by Gizdarski, E., Fujiwara, H.

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  14. 14
    Sequential Circuits with Combinational Test Generation Complexity under Single-Fault Assumption

    Sequential Circuits with Combinational Test Generation Complexity under Single-Fault Assumption by Inoue, Michiko, Gizdarski, Emil, Fujiwara, Hideo

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  15. 15
    A class of sequential circuits with combinational test generation complexity under single-fault assumption

    A class of sequential circuits with combinational test generation complexity under single-fault assumption by Inoue, M., Gizdarski, E., Fujiwara, H.

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  16. 16
    A framework for low complexitgy static learning

    A framework for low complexitgy static learning by Gizdarski, Emil, Fujiwara, Hideo

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  17. 17
    Understanding yield losses in logic circuits

    Understanding yield losses in logic circuits by Appello, D., Fudoli, A., Giarda, K., Tancorre, V., Gizdarski, E., Mathew, B.

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