An analytical ion microscope for high-resolution imaging, nanoscale analytics and nanofabrication by Gnauck, Peter, Richter, Torsten, Ost, Alexander

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A new Ion Microscope for high-resolution imaging and SIMS nano-analytics by Ost, Alexander, Richter, Torsten, De Castro, Olivier, Gnauck, Peter, Audinot, Jean-Nicolas, Wirtz, Tom

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The IONMASTER magSIMS: An Innovative Multi-ion Species FIB Platform for Correlative High-resolution Ion Microscopy and SIMS Analyses by Ost, Alexander D, Richter, Torsten, De Castro, Olivier, Gnauck, Peter, Audinot, Jean-Nicolas, Wirtz, Tom

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npSCOPE: A New Multimodal Instrument for In Situ Correlative Analysis of Nanoparticles by De Castro, Olivier, Biesemeier, Antje, Serralta, Eduardo, Bouton, Olivier, Barrahma, Rachid, Hoang, Quang H, Cambier, Sebastien, Taubitz, Tatjana, Klingner, Nico, Hlawacek, Gregor, Pinto, Serge Duarte, Gnauck, Peter, Lucas, Falk, Bebeacua, Cecilia, Wirtz, Tom

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Determination of local resistivity in ceramic composites by electron microscopy by Sempf, Kerstin, Boese, Markus, Gnauck, Peter, Höhn, Sören, Herrmann, Mathias

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npSCOPE: A New Instrument Combining SIMS Imaging, SE Imaging and Transmission Ion Microscopy for High Resolution In-situ Correlative Investigations by De Castro, Olivier, Biesemeier, Antje, Serralta, Eduardo, Klingner, Nico, Hlawacek, Gregor, Gnauck, Peter, Pinto, Serge Duarte, Lucas, Falk, Bebeacua, Cecilia, Wirtz, Tom

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Failure analysis and defect review using extended accuracy of the CrossBeam®Technology by Gnauck, Peter

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Application of the CrossBeam Technology to TEM Sample Preparation and Nanolithography by Gnauck, Peter, Zeile, Ulrike

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Failure analysis and defect review using extended accuracy of the CrossBeam Technology by Gnauck, Peter

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A New High Resolution Field Emission SEM with Variable Pressure Capabilities by Gnauck, Peter, Drexel, Volker, Greiser, J

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Focused Ion Beam Based Sample Preparation Techniques by Langford, R. M., Petford-Long, A. K., Gnauck, P.

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Considerations for Three Dimensional Imaging In the Crossbeam FIB by Lifshin, Eric, Principe, Edward L., Evertsen, James, Dewey, Art, Gnauck, Peter, Friel, John

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In-Situ Ion Milling in the Transmission Electron Microscope (TEM) Outlook to a New Preparation Technique by Gnauck, Peter, Burkhardt, Claus, Plies, Erich, Nisch, Wilfried

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CrossBeam, Principles and Application by Casares, A., Gnauck, P.

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How to Optimize Gross Sectioning and TEM Sample Prep by Gnauck, Peter, Vermeulen, Jack

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25.6-Tb/s WDM Transmission of Polarization-Multiplexed RZ-DQPSK Signals by Gnauck, A.H., Charlet, G., Tran, P., Winzer, P.J., Doerr, C.R., Centanni, J.C., Burrows, E.C., Kawanishi, T., Sakamoto, T., Higuma, K.

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100-Gb/s DQPSK Transmission: From Laboratory Experiments to Field Trials by Winzer, P.J., Raybon, G., Haoyu Song, Adamiecki, A., Corteselli, S., Gnauck, A.H., Fishman, D.A., Doerr, C.R., Chandrasekhar, S., Buhl, L.L., Xia, T.J., Wellbrock, G., Lee, W., Basch, B., Kawanishi, T., Higuma, K., Painchaud, Y.

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Mode-Division Multiplexing Over 96 km of Few-Mode Fiber Using Coherent 6 × 6 MIMO Processing by RYF, Roland, RANDEL, Sebastian, PECKHAM, David W, MCCURDY, Alan H, LINGLE, Robert, GNAUCK, Alan H, BOLLE, Cristian, SIERRA, Alberto, MUMTAZ, Sami, ESMAEELPOUR, Mina, BURROWS, Ellsworth C, ESSIAMBRE, Rene-Jean, WINZER, Peter J

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6×56-Gb/s mode-division multiplexed transmission over 33-km few-mode fiber enabled by 6×6 MIMO equalization by Randel, Sebastian, Ryf, Roland, Sierra, Alberto, Winzer, Peter J, Gnauck, Alan H, Bolle, Cristian A, Essiambre, René-Jean, Peckham, David W, McCurdy, Alan, Lingle, Jr, Robert

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Colorless coherent receiver using 3x3 coupler hybrids and single-ended detection by Xie, Chongjin, Winzer, Peter J, Raybon, Gregory, Gnauck, Alan H, Zhu, Benyuan, Geisler, Tommy, Edvold, Bent

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