Search Results - Gościński, Krzysztof

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  1. 1
    The Photoionization Processes of Deep Trap Levels in n-GaN Films Grown by MOVPE Technique on Ammono-GaN Substrates

    The Photoionization Processes of Deep Trap Levels in n-GaN Films Grown by MOVPE Technique on Ammono-GaN Substrates by Kruszewski, Piotr, Sakowski, Konrad, Gościński, Krzysztof, Prystawko, Paweł

    Published in Applied sciences
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  2. 2
    Surface Recombination and Space-Charge-Limited Photocurrent-Voltage (PC-V) Measurements in (Cd,Mn)Te Samples-Kinetics of Photocurrent (PC)

    Surface Recombination and Space-Charge-Limited Photocurrent-Voltage (PC-V) Measurements in (Cd,Mn)Te Samples-Kinetics of Photocurrent (PC) by Mycielski, Andrzej, Kochanowska, Dominika M, Wardak, Aneta, Gościński, Krzysztof, Szot, Michał, Dobrowolski, Witold, Janusz, Gabriela, Górska, Małgorzata, Janiak, Łukasz, Czarnacki, Wiesław, Świderski, Łukasz, Iwanowska-Hanke, Joanna, Moszyński, Marek

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  3. 3
    Surface Recombination and Space-Charge-Limited Photocurrent-Voltage

    Surface Recombination and Space-Charge-Limited Photocurrent-Voltage by Mycielski, Andrzej, Kochanowska, Dominika M, Wardak, Aneta, Gościński, Krzysztof, Szot, Michał, Dobrowolski, Witold, Janusz, Gabriela, Górska, Małgorzata, Janiak, Łukasz, Czarnacki, Wiesław, Świderski, Łukasz, Iwanowska-Hanke, Joanna, Moszyński, Marek

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  4. 4
    Role of the Hafnium Dioxide Spacer in the ZnO-Based Planar Schottky Diodes Obtained by the Low-Temperature Atomic Layer Deposition Method: Investigations of Current-Voltage Characteristics

    Role of the Hafnium Dioxide Spacer in the ZnO-Based Planar Schottky Diodes Obtained by the Low-Temperature Atomic Layer Deposition Method: Investigations of Current-Voltage Charact... by Zakrzewski, Adam J., Krajewski, Tomasz A., Luka, Grzegorz, Goscinski, Krzysztof, Guziewicz, Elzbieta, Godlewski, Marek

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  5. 5
    Trap levels in the atomic layer deposition-ZnO/GaN heterojunction—Thermal admittance spectroscopy studies

    Trap levels in the atomic layer deposition-ZnO/GaN heterojunction—Thermal admittance spectroscopy studies by Krajewski, Tomasz A., Stallinga, Peter, Zielony, Eunika, Goscinski, Krzysztof, Kruszewski, Piotr, Wachnicki, Lukasz, Aschenbrenner, Timo, Hommel, Detlef, Guziewicz, Elzbieta, Godlewski, Marek

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  6. 6
    Surface recombination and space-charge-limited photocurrent-voltage (PC-V) measurements in (Cd,Mn)Te samples. Kinetics of photocurrent (PC)

    Surface recombination and space-charge-limited photocurrent-voltage (PC-V) measurements in (Cd,Mn)Te samples. Kinetics of photocurrent (PC) by Mycielski, Andrzej, Kochanowska, Dominika M, Wardak, Aneta, Goscinski, Krzysztof, Szot, Michal, Dobrowolski, Witold, Janusz, Gabriela, Gorska, Malgorzata, Janiak, Lukasz, Czarnacki, Wieslaw, Swiderski, Lukasz, Iwanowska-Hanke, Joanna, Moszynski, Marek

    Published in arXiv.org
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  7. 7
    A technique and a system structure for on-line activation moments determination for steady-state optimization

    A technique and a system structure for on-line activation moments determination for steady-state optimization by GOŚCIŃSKI, ANDRZEJ, ZIELIŃSKI, KRZYSZTOF

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  8. 8
    Postoperative radiotherapy and radiotherapy combined with CCNU chemotherapy for treatment of brain gliomas

    Postoperative radiotherapy and radiotherapy combined with CCNU chemotherapy for treatment of brain gliomas by TRAJANOWSKI, T, PESZYNSKI, J, BENDARZEWSKA, B, STASZCZAK, A, KOZNIEWSKA, H, TUROWSKI, K, KAMINSKI, S, GOSCINSKI, I, REINFUS, M, KRZYSZKOWSKI, T, PYRICH, M, BIELAWSKI, A, LESZCZYK, C

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  9. 9
    Influence of the length of disturbance measurement period and measurement costs on the costs of process control

    Influence of the length of disturbance measurement period and measurement costs on the costs of process control by GOŚCIŃSKI, ANDRZEJ, PIEKARZ, BOŻENA, ZIELINSKI, KRZYSZTOF

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