Search Results - Gogolinsky, K. V.

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  1. 1
    The measurement of electrical properties of nanostructures with use of conductive diamond tip

    The measurement of electrical properties of nanostructures with use of conductive diamond tip by Soshnikov, A I, Gogolinsky, K V, Blank, V D, Reshetov, V N

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  2. 2
    Mechanical, structural, and spectroscopic properties of C70 fullerite phases produced under high pressure and shear

    Mechanical, structural, and spectroscopic properties of C70 fullerite phases produced under high pressure and shear by Blank, V. D., Gogolinsky, K. V., Denisov, V. N., Ivdenko, V. A., Mavrin, B. N., Serebryanaya, N. R., Sulyanov, S. N.

    Published in Technical physics
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  3. 3
    Ultrahard and superhard phases of fullerite C 60: Comparison with diamond on hardness and wear

    Ultrahard and superhard phases of fullerite C 60: Comparison with diamond on hardness and wear by Blank, V., Popov, M., Pivovarov, G., Lvova, N., Gogolinsky, K., Reshetov, V.

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  4. 4
    Nano-sclerometry measurements of superhard materials and diamond hardness using scanning force microscope with the ultrahard fullerite C60 tip

    Nano-sclerometry measurements of superhard materials and diamond hardness using scanning force microscope with the ultrahard fullerite C60 tip by Blank, V., Popov, M., Lvova, N., Gogolinsky, K., Reshetov, V.

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  5. 5
    Ultrahard and superhard phases of fullerite C60: Comparison with diamond on hardness and wear

    Ultrahard and superhard phases of fullerite C60: Comparison with diamond on hardness and wear by Blank, V., Popov, M., Pivovarov, G., Lvova, N., Gogolinsky, K., Reshetov, V.

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  6. 6
    Nano-sclerometry measurements of superhard materials and diamond hardness using scanning force microscope with the ultrahard fullerite C 60 tip

    Nano-sclerometry measurements of superhard materials and diamond hardness using scanning force microscope with the ultrahard fullerite C 60 tip by Blank, V., Popov, M., Lvova, N., Gogolinsky, K., Reshetov, V.

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  7. 7
    The investigation of crack propagation in cleavage directions on the surface of SiC by sclerometry

    The investigation of crack propagation in cleavage directions on the surface of SiC by sclerometry by Soshnikov, A., Gogolinsky, K., Blank, V.

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