Investigation of the Hardness and Young’s Modulus in Thin Near-Surface Layers of Silicon Carbide from the Si- and C-Faces by Nanoindentation by Osipov, A. V., Grashchenko, A. S., Gorlyak, A. N., Lebedev, A. O., Luchinin, V. V., Markov, A. V., Panov, M. F., Kukushkin, S. A.

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Comparative Ellipsometric Analysis of Silicon Carbide Polytypes 4H, 15R, and 6H Produced by a Modified Lely Method in the Same Growth Process by Avrov, D. D., Gorlyak, A. N., Lebedev, A. O., Luchinin, V. V., Markov, A. V., Osipov, A. V., Panov, M. F., Kukushkin, S. A.

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Methods of ellipsometric analysis of polarization optical properties of inhomogeneous surface layers of optoelectronics elements by Zemlyanskiĭ, V. S., Khramtsovskiĭ, I. A., Gorlyak, A. N., Stepanchuk, A. A.

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SECTIONING METHOD APPLICATION AT ELLIPSOMETRY OF INHOMOGENEOUS REFLECTION SYSTEMS by A. N. Gorlyak, V. M. Solonukha, I. A. Khramtsovsky

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OPTICAL CHARACTERISTICS DEFINITION OF OPTICAL TECHNOLOGY SURFACE ELEMENTS FOR THEIR OPTICAL CONNECTIONS by Gorlyak, A N, Novak, A, Solonukha, V M, Khramtsovsky, I A

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ELLIPSOMETRY METHOD APPLICATION IN OPTICS OF INHOMOGENEOUS MEDIA by Gorlyak, A N, Khramtsovsky, I A, Solonukha, V M

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SECTIONING METHOD APPLICATION AT ELLIPSOMETRY OF INHOMOGENEOUS REFLECTION SYSTEMS by Gorlyak, A N, Solonukha, V M, Khramtsovsky, I A

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