Search Results - Gotszalk, T.P.

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    Strain relaxation induced surface morphology of heterogeneous GaInNAs layers grown on GaAs substrate

    Strain relaxation induced surface morphology of heterogeneous GaInNAs layers grown on GaAs substrate by Gelczuk, Ł., Jóźwiak, G., Moczała, M., Dłużewski, P., Dąbrowska-Szata, M., Gotszalk, T.P.

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    Scanning Thermal Microscopy in Microsystem Reliability Analysis

    Scanning Thermal Microscopy in Microsystem Reliability Analysis by Szeloch, R.F., Gotszalk, T.P., Janus, P.

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