Search Results - Govindassamy, Goby

  • Showing 1 - 5 results of 5
Refine Results
  1. 1
    Effect of laser repetition rate on the growth of Sc2O3 via pulsed laser deposition

    Effect of laser repetition rate on the growth of Sc2O3 via pulsed laser deposition by Govindassamy, Goby A., Prentice, Jake J., Lunney, James. G., Eason, Robert W., Mackenzie, Jacob I.

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  2. 2
    Sc2O3 on sapphire all-crystalline grating–waveguide resonant reflectors

    Sc2O3 on sapphire all-crystalline grating–waveguide resonant reflectors by Mourkioti, Georgia, Bashir, Danish, Govindassamy, Goby A., Li, Fangfang, Eason, Robert W., Graf, Thomas, Abdou Ahmed, Marwan, Mackenzie, Jacob I.

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  3. 3
    Sub-picosecond 1030 nm laser-induced damage threshold evaluation of pulsed-laser deposited sesquioxide thin films

    Sub-picosecond 1030 nm laser-induced damage threshold evaluation of pulsed-laser deposited sesquioxide thin films by Stehlik, Marek, Govindassamy, Goby, Zideluns, Janis, Lemarchand, Fabien, Wagner, Frank, Lumeau, Julien, Mackenzie, Jacob, Gallais, Laurent

    Published in Optical engineering
    Get full text
    Article
    Save to List
    Saved in:
  4. 4
    Sub-picosecond 1030 nm laser-induced damage threshold evaluation of pulsed-laser deposited sesquioxide thin films

    Sub-picosecond 1030 nm laser-induced damage threshold evaluation of pulsed-laser deposited sesquioxide thin films by Stehlik, Marek, Govindassamy, Goby, Zideluns, Janis, Lemarchand, Fabien, Wagner, Frank, Lumeau, Julien, Mackenzie, Jacob, Gallais, Laurent

    Published in Optical engineering
    Get full text
    Items that cite this one
    Article
    Save to List
    Saved in:
  5. 5
    Sub-picosecond 1030 nm laser-induced damage threshold evaluation of pulsed-laser deposited sesquioxide thin films (Erratum)

    Sub-picosecond 1030 nm laser-induced damage threshold evaluation of pulsed-laser deposited sesquioxide thin films (Erratum) by Stehlik, Marek, Govindassamy, Goby, Zideluns, Janis, Lemarchand, Fabien, Wagner, Frank, Lumeau, Julien, Mackenzie, Jacob, Gallais, Laurent

    Published in Optical engineering
    Get full text
    Article
    Save to List
    Saved in:

Search Tools: