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Search Results - Grigis, Ch
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Element and phase identification via fine structure analysis in EELS: application to MOCVD-Y 1Ba 2Cu 3O 7− δ thin films
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Grigis, Ch
,
Schamm, S
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Ultramicroscopy
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Element and phase identification via fine structure analysis in EELS : application to MOCVD-Y1Ba2Cu3O7-δ thin films
by
GRIGIS, C
,
SCHAMM, S
Published in
Ultramicroscopy
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High-resolution electron microscopy investigations of stacking faults in Y 1 Ba 2 Cu 3 O 7−δ metalorganic chemical vapor deposited thin films
by
Grigis, Ch
,
Schamm, S.
,
Dorignac, D.
Published in
Journal of materials research
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High-resolution electron microscopy investigations of stacking faults in Y1Ba2Cu3O(7-delta) metalorganic chemical vapor deposited thin films
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Grigis, Ch
,
Schamm, S
,
Dorignac, D
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Journal of materials research
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HIGH-RESOLUTION ELECTRON MICROSCOPY INVESTIGATIONS OF STACKING FAULTS IN Y1Ba2Cu3O7-DELTA METALLORGANIC CHEMICAL VAPOUR DEPOSITED THIN FILMS
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Grigis, Ch
,
Schamm, S
,
Dorignac, D
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Journal of materials research
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High-resolution electron microscopy investigations of stacking faults in Y1Ba2Cu3O7−δ metalorganic chemical vapor deposited thin films
by
Grigis, Ch
,
Schamm, S.
,
Dorignac, D.
Published in
Journal of materials research
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