Search Results - Grimaila, MR

  • Showing 1 - 10 results of 10
Refine Results
  1. 1
    Wireless Intrusion Detection and Device Fingerprinting through Preamble Manipulation

    Wireless Intrusion Detection and Device Fingerprinting through Preamble Manipulation by Ramsey, Benjamin W., Mullins, Barry E., Temple, Michael A., Grimaila, Michael R.

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  2. 2
    A simplified control system for a daylight-matched LED lamp

    A simplified control system for a daylight-matched LED lamp by Gilman, JM, Miller, ME, Grimaila, MR

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  3. 3
    A new ATPG algorithm to limit test set size and achieve multiple detections of all faults

    A new ATPG algorithm to limit test set size and achieve multiple detections of all faults by Sooryong Lee, Cobb, B., Dworak, J., Grimaila, M.R., Mercer, M.R.

    Request full text
    Conference Proceeding
    Save to List
    Saved in:
  4. 4
    REDO-random excitation and deterministic observation-first commercial experiment

    REDO-random excitation and deterministic observation-first commercial experiment by Grimaila, M.R., Sooryong Lee, Dworak, J., Butler, K.M., Stewart, B., Balachandran, H., Houchins, B., Mathur, V., Jaehong Park, Wang, L.-C., Mercer, M.R.

    Request full text
    Conference Proceeding
    Save to List
    Saved in:
  5. 5
    Enhanced DO-RE-ME based defect level prediction using defect site aggregation-MPG-D

    Enhanced DO-RE-ME based defect level prediction using defect site aggregation-MPG-D by Dworak, J., Grimaila, M.R., Sooryong Lee, Wang, L.-C., Mercer, M.R.

    Request full text
    Conference Proceeding
    Save to List
    Saved in:
  6. 6
    Minimizing defective part level using a linear programming-based optimal test selection method

    Minimizing defective part level using a linear programming-based optimal test selection method by Yuxin Tian, Grimaila, Weiping Shi, Mercer

    Request full text
    Conference Proceeding
    Save to List
    Saved in:
  7. 7
    On the superiority of DO-RE-ME/MPG-D over stuck-at-based defective part level prediction

    On the superiority of DO-RE-ME/MPG-D over stuck-at-based defective part level prediction by Dworak, J., Grimaila, M.R., Cobb, B., Wang, T.-C., Wang, L.-C., Mercer, M.R.

    Request full text
    Conference Proceeding
    Save to List
    Saved in:
  8. 8
    Defect-oriented testing and defective-part-level prediction

    Defect-oriented testing and defective-part-level prediction by Dworak, J., Wicker, J.D., Lee, S., Grimaila, M.R., Mercer, M.R., Butler, K.M., Stewart, B., Wang, L.-C.

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  9. 9
    Robust functional testing for VLSI cellular neural network implementations

    Robust functional testing for VLSI cellular neural network implementations by Grimaila, M.R., de Gyvez, J.P., Gunhee Han

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  10. 10
    Maximizing business information security's educational value

    Maximizing business information security's educational value by Grimaila, M.R.

    Get full text
    Items that this one cites
    Items that cite this one
    Magazinearticle
    Save to List
    Saved in:

Search Tools: