Search Results - Groenland, A.W.

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  1. 1
    Stability of thin platinum films implemented in high-temperature microdevices

    Stability of thin platinum films implemented in high-temperature microdevices by Tiggelaar, R.M., Sanders, R.G.P., Groenland, A.W., Gardeniers, J.G.E.

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    Characterisation and passivation of interface defects in (100 ) -Si /SiO2 /HfO2 /TiN gate stacks

    Characterisation and passivation of interface defects in (100 ) -Si /SiO2 /HfO2 /TiN gate stacks by HURLEY, P. K, CHERKAOUI, K, MCDONNELL, S, HUGHES, G, GROENLAND, A. W

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    Characterisation and passivation of interface defects in (1 0 0)-Si/SiO 2/HfO 2/TiN gate stacks

    Characterisation and passivation of interface defects in (1 0 0)-Si/SiO 2/HfO 2/TiN gate stacks by Hurley, P.K., Cherkaoui, K., McDonnell, S., Hughes, G., Groenland, A.W.

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    Four point probe structures with buried electrodes for the electrical characterization of ultrathin conducting films

    Four point probe structures with buried electrodes for the electrical characterization of ultrathin conducting films by Groenland, A.W., Wolters, R.A.M., Kovalgin, A.Y., Schmitz, J.

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