Search Results - Groopman, E.E.

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  1. 1
    Positive ion SIMS-SSAMS for trace analysis of materials

    Positive ion SIMS-SSAMS for trace analysis of materials by Grabowski, K.S., Groopman, E.E., Rock, B.Y., Imam, M.A.

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  2. 2
    Enhanced spatially-resolved trace analysis using combined SIMS–single-stage AMS

    Enhanced spatially-resolved trace analysis using combined SIMS–single-stage AMS by Grabowski, K.S., Groopman, E.E., Fahey, A.J.

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  3. 3
    Reprint Of: Enhanced spatially-resolved trace analysis using combined SIMS–single-stage AMS

    Reprint Of: Enhanced spatially-resolved trace analysis using combined SIMS–single-stage AMS by Grabowski, K.S., Groopman, E.E., Fahey, A.J.

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