Search Results - Grozev, Grozdan

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  1. 1
    Roughness analysis of lithographically produced nanostructures: off-line measurement and scaling analysis

    Roughness analysis of lithographically produced nanostructures: off-line measurement and scaling analysis by Patsis, George P., Constantoudis, Vasilios, Tserepi, Angeliki, Gogolides, Evangelos, Grozev, Grozdan, Hoffmann, Thomas

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    Design Considerations for Anti-reflection Layer in Thin Imaging System

    Design Considerations for Anti-reflection Layer in Thin Imaging System by Malik, Sanjay, De, Binod, Biafore, John, Spaziano, Greg, Sarubbi, Tom, Dilocker, Stephanie, Bowden, Murrae, Reybrouc, Mario, Grozev, Grozdan, Driessche, Veerle van, Tzviatkov, Plamen

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    Optically enhanced i-line lithography for 0.3-micrometer random logic applications

    Optically enhanced i-line lithography for 0.3-micrometer random logic applications by Yen, Anthony, Tzviatkov, Plamen, Grozev, Grozdan

    Published in Solid state technology
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