Search Results - Guéguan, G.

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    Dielectric microwave characterizations of (Ba,Sr)TiO3 film deposited on high resistivity silicon substrate: Analysis by two-dimensional tangential finite element method

    Dielectric microwave characterizations of (Ba,Sr)TiO3 film deposited on high resistivity silicon substrate: Analysis by two-dimensional tangential finite element method by Ponchel, F., Midy, J., Legier, J. F., Soyer, C., Rémiens, D., Lasri, T., Guéguan, G.

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  2. 2
    Dielectric microwave characterizations of ( Ba , Sr ) TiO 3 film deposited on high resistivity silicon substrate: Analysis by two-dimensional tangential finite element method

    Dielectric microwave characterizations of ( Ba , Sr ) TiO 3 film deposited on high resistivity silicon substrate: Analysis by two-dimensional tangential finite element method by Ponchel, F., Midy, J., Legier, J. F., Soyer, C., Rémiens, D., Lasri, T., Guéguan, G.

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