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    Characterizing THz Scattering Loss in Nano-Scale SOI Waveguides Exhibiting Stochastic Surface Roughness with Exponential Autocorrelation

    Characterizing THz Scattering Loss in Nano-Scale SOI Waveguides Exhibiting Stochastic Surface Roughness with Exponential Autocorrelation by Guiana, Brian, Zadehgol, Ata

    Published in Electronics (Basel)
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