Search Results - Guibaud, Gérald

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  1. 1
    Localization and Physical Analysis of Defects in Degraded Power HEMT p-GaN Transistors Stressed with DC Voltage Surge and Voltage with Switching Stress

    Localization and Physical Analysis of Defects in Degraded Power HEMT p-GaN Transistors Stressed with DC Voltage Surge and Voltage with Switching Stress by Ghizzo, Lucien, Guibaud, Gérald, De Nardi, Christophe, Jamin, François, Chazal, Vanessa, Trémouilles, David, Monflier, Richard, Richardeau, Frédéric, Bascoul, Guillaume, González Sentís, Manuel

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  2. 2
    Analysis of Failure Mechanisms Occuring at Breakdown Voltage in power p-GaN HEMT

    Analysis of Failure Mechanisms Occuring at Breakdown Voltage in power p-GaN HEMT by Ghizzo, Lucien, Tremouilles, David, Guibaud, Gerald, de Nardi, Christophe, Chazal, Vanessa, Chauvin, Helene, Jamin, Francois, Richardeau, Frederic

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    Reactivity to Visual Signals and the Cerebellar Vermis: Evidence From a Rare Case With Rhombencephalosynapsis

    Reactivity to Visual Signals and the Cerebellar Vermis: Evidence From a Rare Case With Rhombencephalosynapsis by Michael, George A, Garcia, Sophie, Bussy, Gérald, Lion-François, Laurence, Guibaud, Laurent

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